Effect of natural radiation on sensitive devices

Zapraszamy na wykład Effect of natural radiation on sensitive devices, który wygłosi dr Frederic WROBEL z l’institut d’electronique, Universite Montpelleir, Francja.

Wykład prowadzony będzie w języku angielskim.

Terminy wykładów:
17 stycznia (wtorek) godz. 16,15-18,00 sala A1
18 stycznia (środa) godz. 16,15-19,00 sala NL327
19 stycznia (czwartek) godz. 16,15-19,00 sala NL327
24 stycznia (wtorek) godz. 16,15-18,00 sala A1

Za zaliczenie wykładów można otrzymać 2 punkty ECTS!

Radiation-induced failure in microelectronics is a crucial issue in the aerospace and avionic communities. Incident radiation acting on these devices is mainly due to cosmic rays and their secondary particles produced in the Earth atmosphere. These particles induce various dysfunctions through their interaction with the electronic device materials. Due to device integration this is now an issue for all commercial applications. The aim of this course is to present the natural radiative environment, its consequences on electronic devices, and to present an example of a design of on board scientific experiments.
After a brief introduction, the radiative environment will be presented for space and atmospheric applications. Then, the effects of radiations on matter will be discussed in detail to allow concluding that the generation of electron-hole pairs is a crucial phenomenon. Different effects that can be induced in microelectronics will be presented. As an example, we will then focus on soft errors induced in atmospheric environment. We will present the principles of simulation tools which are very useful to establish the transient current shapes and to evaluate the soft error rate. This kind of code can be validated thanks to accelerated tests under beam and/or accelerated test in natural environment (i.e. in altitude). Finally, we will present a scientific experiment which aims to better understand the radiative environment from ground level up to the stratosphere. We will then present the design of experimental on board instruments to address this issue.